Schmid factor aided slip pattern analysis; A method for determination of orientations of FCC crystals from slip traces

Abstract

This study introduces a fast and cost-effective method for accurate crystallographic orientation determination from slip patterns of four and three traces, and from two traces with limited certainty. The method combines established graph-based and trigonometric methods and adds three new key elements: subsequent uniaxial stresses in X and Y directions, dark-field microscopy, and Schmid's law. Developed for face centered cubic (FCC) materials with low stacking fault energy and annealed structures, the method utilizes MATLAB-based algorithms and custom-built image processing software for enhanced efficiency. Its accuracy is validated against electron backscatter diffraction (EBSD) data collected prior to compression testing and slip pattern analysis. The developed software tools are made available with the study. This method offers significant potential for efficient texture and slip trace analysis.