Millimeter-Wave Channel Measurements at 28 GHz in Digital Fabrication Facilities
Solomitckii, Dmitrii; Allén, Markus; Valkama, Mikko; Koucheryavy, Yevgeni (2019-10-21)
Solomitckii, Dmitrii
Allén, Markus
Valkama, Mikko
Koucheryavy, Yevgeni
21.10.2019
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Julkaisun pysyvä osoite on
https://urn.fi/URN:NBN:fi:tuni-202001151280
https://urn.fi/URN:NBN:fi:tuni-202001151280
Kuvaus
Peer reviewed
Tiivistelmä
The unprecedented amount of bandwidth available at the millimeter-wave band brings new opportunities for the next-generation factory automation. By supporting these frequencies, the communication technologies may significantly improve the safety and efficiency of manufacturing processes. This paper presents channel measurement results at 28 GHz in a factory environment. The primary channel properties such as path loss, delay, and angular spread are evaluated. Additionally, the distribution of the cross-polarization ratio is shown.
Kokoelmat
- TUNICRIS-julkaisut [19351]