The effect of USB ground cable and product dynamic capacitance on IEC61000-4-2 qualification

Tamminen, Pasi; Ukkonen, Leena; Sydänheimo, Lauri (2015-09-27)
 
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Tamminen, Pasi
Ukkonen, Leena
Sydänheimo, Lauri
27.09.2015

7B.2
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doi:10.1109/EOSESD.2015.7314766
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https://urn.fi/URN:NBN:fi:tty-201603013600

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EC61000-4-2 discharge stress levels are studied with varying product capacitance and ground connections. Stress levels are evaluated based on the measured and simulated peak current, peak power, pulse rise time, and energy transfer along to the USB cable. These stress parameters can be significantly affected by adjusting the test setup.
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