Development of measurement setup for characterization of high-power infrared Vertical-Cavity Surface-Emitting Laser arrays
Filipchuk, Anna (2021)
2021
Bachelor's Programme in Science and Engineering
Tekniikan ja luonnontieteiden tiedekunta - Faculty of Engineering and Natural Sciences
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Hyväksymispäivämäärä
2021-05-24
Julkaisun pysyvä osoite on
https://urn.fi/URN:NBN:fi:tuni-202105165039
https://urn.fi/URN:NBN:fi:tuni-202105165039
Tiivistelmä
Laser technology market is rapidly developing as it provides innovative solutions to common problems in areas of ranging and surveying, communications, welding, and medicine. As the new types of lasers appear they require fast, simple, and versatile methods of characterization to conclude their competitive value.
Vertical-cavity surface-emitting lasers (VCSELs) are a particular type of semiconductor lasers, characterized by lasing happening perpendicular to the surface of the laser. This type of structural confinement leads to a remarkable set of characteristics they possess, which causes an increased interest in VCSEL development.
In this thesis the need for a measurement setup applicable for high-power IR VCSEL arrays characterization is addressed. The theoretical background behind laser operation is reviewed along with VCSELs specifications to identify key features of VCSELs to be considered in the measurement setup construction.
Prior to the experimental part of the research, the set of key parameters for laser array characterization is determined. They include: light-current-voltage curve (LIV-curve), beam profile, spectrum, number of lasing single emitters and temperature behavior characterization. The fundamental methods for obtaining them are reviewed to define essential components of the future measurement setup.
Once all the components are identified the setup is constructed. The developed versatile setup provides the possibility of characterization of various VCSEL array parameters. The desirable combination of simplicity of operation along with the easiness of reconstruction between possible setup versions is achieved. The setup is further tested to validate accuracy and repeatability of the measurements performed. This is done by performing testing on commercial VCSEL arrays with beforehand known parameter values.
The further research could be dedicated to identifying the setup configuration, where all parameters of interest could be measured simultaneously without the need for setup reconfiguration. The optimal VCSEL array packaging which would provide the possibility for fast testing and ensure laser chip staying intact could also be investigated.
Vertical-cavity surface-emitting lasers (VCSELs) are a particular type of semiconductor lasers, characterized by lasing happening perpendicular to the surface of the laser. This type of structural confinement leads to a remarkable set of characteristics they possess, which causes an increased interest in VCSEL development.
In this thesis the need for a measurement setup applicable for high-power IR VCSEL arrays characterization is addressed. The theoretical background behind laser operation is reviewed along with VCSELs specifications to identify key features of VCSELs to be considered in the measurement setup construction.
Prior to the experimental part of the research, the set of key parameters for laser array characterization is determined. They include: light-current-voltage curve (LIV-curve), beam profile, spectrum, number of lasing single emitters and temperature behavior characterization. The fundamental methods for obtaining them are reviewed to define essential components of the future measurement setup.
Once all the components are identified the setup is constructed. The developed versatile setup provides the possibility of characterization of various VCSEL array parameters. The desirable combination of simplicity of operation along with the easiness of reconstruction between possible setup versions is achieved. The setup is further tested to validate accuracy and repeatability of the measurements performed. This is done by performing testing on commercial VCSEL arrays with beforehand known parameter values.
The further research could be dedicated to identifying the setup configuration, where all parameters of interest could be measured simultaneously without the need for setup reconfiguration. The optimal VCSEL array packaging which would provide the possibility for fast testing and ensure laser chip staying intact could also be investigated.
Kokoelmat
- Kandidaatintutkielmat [8453]