Kandidaatintutkielmat - Trepo

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Ionizing radiation measurement and calculation of gamma buildup factors for point sources

Herpin, Antoine (2023)
Kandidaatintyö
Methods for minimising surface leakage currents of surface treated planar silicon neutron detectors

Ranta, Mikko (2025)
Kandidaatintyö
Single-Event Effects and Radiation Hardening in Digital Circuits

Kelavuori, Joonas (2025)
Kandidaatintyö

Single-event effects (SEEs) are a group of phenomena manifesting for the most part, in integrated circuits (ICs). SEEs are disruptions in the operation of circuits, that are caused by ionizing radiation. The kind of ionizing ...