Deposition of Ureido and Methacrylate Functionalities onto Silica Nanoparticles and Its Effect on the Properties of Polypropylene-Based Nanodielectrics
Mahtabani, Amirhossein; Niittymäki, Minna; Anyszka, Rafal; Rytöluoto, Ilkka; He, Xiaozhen; Saarimäki, Eetta; Lahti, Kari; Paajanen, Mika; Dierkes, Wilma; Blume, Anke (2021)
Mahtabani, Amirhossein
Niittymäki, Minna
Anyszka, Rafal
Rytöluoto, Ilkka
He, Xiaozhen
Saarimäki, Eetta
Lahti, Kari
Paajanen, Mika
Dierkes, Wilma
Blume, Anke
2021
Julkaisun pysyvä osoite on
https://urn.fi/URN:NBN:fi:tuni-202110057389
https://urn.fi/URN:NBN:fi:tuni-202110057389
Kuvaus
Peer reviewed
Tiivistelmä
Surface modification of nanoparticles is often utilized to tailor the interfacial properties in dielectric nanocomposites. Introducing different functional groups to the nanoparticles’ surface may induce localized states (traps) that can enhance the dielectric performance of the material depending on their density and energy levels. Furthermore, surface modification of the filler can affect the dispersion quality and crystallization of the nanocomposites which can ultimately alter the dielectric response of the material. In this study, functionalization of silica nanoparticles is demonstrated using 3-(trimethoxysilyl)propyl methacrylate (TMPM) and 1-[3-(trimethoxysilyl)propyl]urea (TMPU) as modifying agents. The effect of such modifications on the crystallization behavior, dispersion quality of the nanoparticles, as well as charge trapping and transport under a medium DC field is studied in nanocomposites based on polypropylene (PP)/ethylene-octene-copolymer (EOC) blends at 1% and 5% of filler concentrations. The results show that both ureido and methacrylate functional groups introduce localized states, but with different energy levels. Nitrogen containing ureido groups in TMPU tend to introduce deeper traps to the filler-polymer interfaces, compared to the methacrylate silane modification. Comparing the two types of surface functionalization, the ureido-functionalized silica resulted in a suppression of space charge formation at the interfaces under a medium DC electric field, despite the relatively larger mean cluster size of nanoparticles.
Kokoelmat
- TUNICRIS-julkaisut [19195]