Interference system for high pressure environment
Kumpulainen, Tero; Singh, Amandeep; März, Thomas; Dong, Litong; Reuna, Jarno; Vihinen, Jorma; Li, Dayou; Levänen, Erkki (2021-10)
Kumpulainen, Tero
Singh, Amandeep
März, Thomas
Dong, Litong
Reuna, Jarno
Vihinen, Jorma
Li, Dayou
Levänen, Erkki
10 / 2021
107278
Julkaisun pysyvä osoite on
https://urn.fi/URN:NBN:fi:tuni-202106216002
https://urn.fi/URN:NBN:fi:tuni-202106216002
Kuvaus
Peer reviewed
Tiivistelmä
Laser interference patterning or lithography has been used in variety of the applications using, patterning, masking and processing structures at top of material. It offers fast processing over as large areas can be processed simultaneously. Additionally, fine patterns are possible to achieve both in micro and sub-micro scale. In this manuscript is presented novel concept to combine interference patterning and high-pressure processing environment. With aid of high-pressure system, it is possible to control processing environment and add co-solvents in desired state (liquid, gas, supercritical) and use developed system as controlled reactive environment in the future studies. Two systems were developed and assembled for testing and proofing the concept. The results of the two 4-beam interference systems (lens- and mirror-based) are presented and compared.
Kokoelmat
- TUNICRIS-julkaisut [19288]