Millimeter-Wave Channel Measurements at 28 GHz in Digital Fabrication Facilities

Abstract

The unprecedented amount of bandwidth available at the millimeter-wave band brings new opportunities for the next-generation factory automation. By supporting these frequencies, the communication technologies may significantly improve the safety and efficiency of manufacturing processes. This paper presents channel measurement results at 28 GHz in a factory environment. The primary channel properties such as path loss, delay, and angular spread are evaluated. Additionally, the distribution of the cross-polarization ratio is shown.