TUNICRIS-julkaisut - Trepo

Viitteet 1-1 / 1

Long-term reliability of naturally aged hafnium oxide ferroelectric transistors for energy-efficient embedded memory

Senapati, Asim; Das, Apu; Paul, Agniva; Sk, Masud Rana; Raffel, Yannick; Olivo, Ricardo; Srivari, Padma; Kumar, Gautham; Chakrabarti, Bhaswar; Majumdar, Sayani; Padovani, Andrea; De, Sourav (21.01.2026)
article

Ferroelectric field-effect transistors (FeFETs) based on hafnium oxide remain promising for embedded non-volatile memory, yet their long-term stability under realistic storage conditions is not well understood. Here, we ...